N23010 Series High Precision Multi Channel Programmable DC Power Supply for Semiconductor Testing

• After-sales Service: 1 Years Warranty
• Warranty: 1 Years
• Voltage Range: 0~15V
• Current Range: 0~5A
• Display: LCD Screen
• Interface: LAN Port, RS232 Interface
• Model NO.: N23010
• Protocol: Scpi Protocol
• AC Power Supply: Single Phase 100~240V AC, Frequency 47Hz~63Hz
• Application: to Complete Htol, Ltol, Elfr/Efr, Hast, Thb, etc.
• Transport Package: Carton
• Specification: 132.5mm(H)*482mm(W)*559mm(D)
• Trademark: NGI
• Origin: China
• HS Code: 9030849000
• Production Capacity: 50000/Year

Product Description

N23010 series is a high-precision, multi-channel programmable DC power supply specially developed for the semiconductor industry, which can provide high-precision, stable and pure power for chips, and cooperate with the environmental test chamber for a number of environmental reliability tests. Its voltage accuracy up to 0.01%, support μA level current measurement, up to 24 channels for single unit, support local/remote (LAN/RS232/CAN) control to meet the needs of chip batch automatic testing.

Main Features

Voltage precision 0.6mV

Long-term stability 80ppm/1000h

Up to 24 channels for single unit

Voltage ripple noise ≤2mVrms

Standard 19-inch 3U chassis

Developed for the semiconductor industry

Application Fields

To complete HTOL, LTOL, ELFR/EFR, HAST, THB, etc., and support chip leakage current measurement test within Environmental Test Chamber.

Functions & Advantages

Accuracy and stability ensure test reliability

Reliability test usually requires multiple chips to run for a long time under power supply. Take HTOL as an example, the number of samples are at least 231 pieces and the test time is up to 1000 hours. N23010 voltage precision is 0.6mV, long-term stability 80ppm/1000h, voltage ripple noise ≤2mVrms can effectively ensure the reliability of the user test process all round protection, ensure the safety of instruments and products under test.

Ultra-high integration, saving user investment

In the process of chip R&D, flow sheet and mass production. Usually it is necessary to carry out reliability test on multiple groups of samples. In addition, the leakage current of chip or jointed board is also an important test index. The traditional scheme usually adopts multiple linear power sources with data sampling, which is troublesome to connect and occupies test space. The N23010 integrates up to 24 power channels in a 19-inch 3U chassis to support μA-level current measurement, providing a highly integrated solution for large-scale chip testing.

Fast dynamic response

N23010 is provided fast dynamic response capability, under the full voltage output, the load changes from 10% to 90%, voltage recovery to the original voltage reduction within 50mV time is less then 200μs, it can ensure that the voltage or current rise waveform within high speed and no over impulse, and it can provide stable power supply for the chip under test.

Sequence editing

N23010 supports sequence editing function. Users can set output voltage, output current and single step running time. 100 groups of voltage and current sequences can be customized locally.

Various communication interface, meet the requirement of automatic test

Supporting RS232, LAN, CAN port, convenient for users to build automatic test system